Ivan Grokhotkov fa13b31dca ci(sdspi): clean up newlib memory, reset between tests ...

Two changes to make the tests less susceptible to random failures:
- Free up newlib memory to not have false-positive memory leaks due to
  lazy allocations in reent structure
- Reset between tests, so that one failing test doesn't cause
  subsequent tests to fail

Both changes are already applied to esp_driver_sdmmc test app.

2024-08-30 11:54:29 +08:00

..

sdspi

ci(sdspi): clean up newlib memory, reset between tests

2024-08-30 11:54:29 +08:00

.build-test-rules.yml

fix(sdspi): fixed sdspi on p4, s3

2024-08-30 11:50:45 +08:00