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esp-idf/components/fatfs/test_apps
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Adam Múdry 381d0fe032 sdmmc: add vTaskDelay to loops to prevent potential WDT trigger 
Also change timeout to 120 seconds in fatfs sdcard pytest to prevent failing during formatting.
2023-04-11 11:06:56 +00:00
..
flash_ro
esp32h2: add build test
2023-01-17 10:29:04 +08:00
flash_wl
fatfs: added an API to format FAT on spiflash
2023-02-16 12:19:35 +08:00
sdcard
sdmmc: add vTaskDelay to loops to prevent potential WDT trigger
2023-04-11 11:06:56 +00:00
test_fatfs_common
…
README.md
fatfs: add missing readme file for the test apps
2022-10-10 12:15:56 +02:00

README.md

fatfs component target tests

This directory contains tests for fatfs component which are run on chip targets.

See also test_fatfs_host directory for the tests which run on a Linux host.

Fatfs tests can be executed with different diskio backends: diskio_sdmmc (SD cards over SD or SPI interface), diskio_spiflash (wear levelling in internal flash) and diskio_rawflash (read-only, no wear levelling, internal flash). There is one test app here for each of these backends:

  • sdcard — runs fatfs tests with an SD card over SDMMC or SDSPI interface
  • flash_wl - runs fatfs test in a wear_levelling partition in SPI flash
  • flash_ro - runs fatfs test in a read-only (no wear levelling) partition in SPI flash

These test apps define:

  • test functions
  • setup/teardown routines
  • build/test configurations
  • pytest test runners

The actual test cases (many of which are common between the test apps) are defined in the test_fatfs_common component.