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https://github.com/espressif/esp-idf
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fa13b31dca
Two changes to make the tests less susceptible to random failures: - Free up newlib memory to not have false-positive memory leaks due to lazy allocations in reent structure - Reset between tests, so that one failing test doesn't cause subsequent tests to fail Both changes are already applied to esp_driver_sdmmc test app.
14 lines
356 B
Python
14 lines
356 B
Python
# SPDX-FileCopyrightText: 2022-2024 Espressif Systems (Shanghai) CO LTD
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# SPDX-License-Identifier: CC0-1.0
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import pytest
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from pytest_embedded_idf import IdfDut
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@pytest.mark.esp32
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@pytest.mark.esp32c3
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@pytest.mark.esp32s3
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@pytest.mark.esp32p4
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@pytest.mark.sdcard_spimode
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def test_sdspi(dut: IdfDut) -> None:
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dut.run_all_single_board_cases(reset=True)
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