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esp-idf/components/driver/test_apps/sdio
History
Konstantin Kondrashov c350c3c504 Merge branch 'feature/cleanup_wrong_log_use' into 'master' 
all: Removes unnecessary newline character in logs

Closes IDFGH-10197

See merge request
2023-06-15 21:49:49 +08:00
..
main
all: Removes unnecessary newline character in logs
2023-06-09 03:31:21 +08:00
CMakeLists.txt
driver:Trim the build components
2023-06-13 14:24:44 +08:00
pytest_sdio.py
CI: sdcard tests fail fix
2023-05-10 16:48:03 +02:00
README.md
sdio: c6 support
2023-01-18 02:34:46 +00:00
sdkconfig.defaults
test: move sdio unit-test to test_apps
2022-11-16 11:22:31 +08:00

README.md

Supported Targets ESP32 ESP32-C6