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esp-idf/components/driver/test_apps
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Chen Yu Dong d3716c439d Merge branch 'ci/add_generic_to_xtal_26mhz_runners' into 'master' 
CI: add generic to xtal_26mhz jobs

See merge request espressif/esp-idf!21725
2022-12-22 10:56:25 +08:00
..
components
build: Adds support for universal Clang toolchain
2022-11-23 13:25:16 +03:00
dac_test_apps
dac: update API and file format aligning to the rule
2022-11-03 13:04:50 +08:00
gpio
gpio: Refactor pytest_gpio to separate cases with labels, and update to use new IdfDut class in pytest_embedded_idf
2022-12-20 15:28:33 +08:00
gptimer
CI: add generic to xtal_40mhz jobs
2022-12-21 11:53:38 +08:00
i2s_test_apps
Merge branch 'ci/enable_esp32c6_target_test_stage' into 'master'
2022-11-29 19:54:05 +08:00
legacy_adc_driver
CI: add generic to xtal_40mhz jobs
2022-12-21 11:53:38 +08:00
legacy_mcpwm_driver
ci: Disable all currently failed target tests for esp32c6
2022-11-28 12:09:08 +08:00
legacy_pcnt_driver
pcnt: Re-enable legacy pcnt test for esp32c6 (ledc support completed)
2022-12-20 15:28:33 +08:00
legacy_rmt_driver
ci: Make consistence between pytest_*.py and .build-test-rules.yml for esp32c6 (i.e. to pass check_test_scripts_build_test_rules.py)
2022-11-28 11:58:30 +08:00
legacy_rtc_temp_driver
ci: Make consistence between pytest_*.py and .build-test-rules.yml for esp32c6 (i.e. to pass check_test_scripts_build_test_rules.py)
2022-11-28 11:58:30 +08:00
legacy_timer_driver
ci: Disable all currently failed target tests for esp32c6
2022-11-28 12:09:08 +08:00
mcpwm
ci: Disable all currently failed target tests for esp32c6
2022-11-28 12:09:08 +08:00
pulse_cnt
ci: Enable esp32c6 example, test_apps, and unit tests CI build stage
2022-11-01 11:23:21 +08:00
rmt
ci: Disable all currently failed target tests for esp32c6
2022-11-28 12:09:08 +08:00
rs485
test: move rs485 test to test_app
2022-11-11 16:59:40 +08:00
sdio
example/sdio: add support for ESP32-S3 as host (via SD)
2022-11-21 14:03:41 +08:00
sdm
ci: Make consistence between pytest_*.py and .build-test-rules.yml for esp32c6 (i.e. to pass check_test_scripts_build_test_rules.py)
2022-11-28 11:58:30 +08:00
spi
test: enable multi-board test of spi for c6
2022-12-07 11:37:48 +08:00
temperature_sensor
ci: Make consistence between pytest_*.py and .build-test-rules.yml for esp32c6 (i.e. to pass check_test_scripts_build_test_rules.py)
2022-11-28 11:58:30 +08:00
touch_sensor_v1
touch_senser: fixed ci issue timer expired after it is deleted
2022-09-05 18:25:32 +08:00
touch_sensor_v2
touch_sensor: fix touch_sensor_v1 filter issue
2022-08-23 07:34:51 +00:00
twai
twai: add initial version of driver component test
2022-11-04 17:40:29 +08:00
uart
test: move uart test to test_app
2022-11-11 16:59:40 +08:00