esp-idf/components
Ivan Grokhotkov b7e5b28f49 sdmmc: update unit tests for ESP_eMMC_TestBoard_V1
1. New tests for SD card on slot 0. Currently frequency for 4-bit mode
has to be reduced in the test.

2. Change pin for CD/WP tests, re-enable CD tests.
2018-08-30 13:14:26 +08:00
..
2018-08-07 11:28:54 +05:30
2018-08-02 11:02:45 +02:00
2018-06-10 21:20:55 +08:00
2018-08-30 13:11:54 +08:00
2018-08-13 16:48:27 +00:00