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esp-idf/components/driver/test_apps
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Wan Lei e7c520e849 Merge branch 'feature/add_spi_ckl_source_selectable' into 'master' 
spi_master: add feature spi periph clk source selectable

Closes IDF-6289

See merge request espressif/esp-idf!21324
2023-01-19 00:54:24 +08:00
..
components
Merge branch 'feature/add_spi_ckl_source_selectable' into 'master'
2023-01-19 00:54:24 +08:00
dac_test_apps
…
gpio
gpio: Add support for esp32h2
2023-01-18 11:41:12 +08:00
gpio_extensions
fix pcnt sdm pre-commit failure
2023-01-17 15:28:27 +08:00
gptimer
esp32h2: add build test
2023-01-17 10:29:04 +08:00
i2s_test_apps
i2s_test: fix output half sample rate failure
2023-01-17 11:37:22 +08:00
ledc
ledc: Move ledc unit test to test_apps pytest framework
2022-12-21 12:04:42 +08:00
legacy_adc_driver
adc: support ADC on esp32c6 (driver/test/example)
2022-12-23 11:24:06 +08:00
legacy_mcpwm_driver
mcpwm: enable test on esp32c6
2022-12-22 11:17:38 +08:00
legacy_pcnt_driver
fix pcnt sdm pre-commit failure
2023-01-17 15:28:27 +08:00
legacy_rmt_driver
rmt: support esp32h2
2023-01-18 11:40:35 +08:00
legacy_rtc_temp_driver
…
legacy_timer_driver
esp32h2: add build test
2023-01-17 10:29:04 +08:00
mcpwm
mcpwm: support non-varg version of generator functions
2023-01-03 14:42:49 +08:00
pulse_cnt
fix pcnt sdm pre-commit failure
2023-01-17 15:28:27 +08:00
rmt
rmt: support esp32h2
2023-01-18 11:40:35 +08:00
rs485
esp32h2: add build test
2023-01-17 10:29:04 +08:00
sdio
sdio: c6 support
2023-01-18 02:34:46 +00:00
spi
spi_master: add feature spi periph clk source selectable
2023-01-18 15:40:12 +08:00
temperature_sensor
…
touch_sensor_v1
…
touch_sensor_v2
…
twai
…
uart
esp32h2: add build test
2023-01-17 10:29:04 +08:00