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esp-idf/components/mbedtls/test_apps/main
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Laukik Hase 47c153ad9e
mbedtls/test_apps: Fix performance logs 
- For esp32-c2, the `CONFIG_NEWLIB_NANO_FORMAT` is enabled by
  default which does not allow printing `int64_t` values
- Copied these values to a `uint32_t` variable for printing
  them properly
2023-02-24 12:26:21 +05:30
..
crts
…
app_main.c
…
CMakeLists.txt
mbedtls: Remove -Wno-format compile option for test app
2023-02-08 12:31:09 +05:30
test_aes_gcm.c
mbedtls: added a test of different auth-tag lengths in AES-GCM
2023-01-16 15:04:08 +05:30
test_aes_perf.c
…
test_aes_sha_parallel.c
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test_aes_sha_rsa.c
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test_aes.c
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test_apb_dport_access.c
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test_apb_dport_access.h
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test_ecp.c
mbedtls/test_apps: Fix performance logs
2023-02-24 12:26:21 +05:30
test_esp_crt_bundle.c
esp32h2(ci): enable target test
2023-02-15 10:20:43 +08:00
test_mbedtls_ecdsa.c
mbedtls/test_apps: Fix performance logs
2023-02-24 12:26:21 +05:30
test_mbedtls_mpi.c
…
test_mbedtls_sha.c
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test_mbedtls_utils.c
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test_mbedtls_utils.h
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test_mbedtls.c
…
test_rsa.c
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test_sha_perf.c
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test_sha.c
mbedtls: Remove -Wno-format compile option for test app
2023-02-08 12:31:09 +05:30